The Reliability Society is a technical Society within the IEEE, the world’s leading association for the advancement of technology.  We are a volunteer group of professionals engaged in assuring reliability in the engineering disciplines of hardware, software, and human factors.  The RS is focused on the broad aspects of reliability, allowing us to be seen as the IEEE Specialty Engineering organization.  We are concerned with attaining and sustaining these design attributes throughout the total life cycle.  We have the management, resources, and administrative and technical structures to develop and to provide technical information via publications, training, conferences, and technical library (IEEE Xplore) data to both our members and to the Specialty Engineering community.  The Reliability Society has 24 chapters and members in 60 countries worldwide.

In its role of providing reliability aspects of Specialty Engineering resources, the RS disciplines span all design engineering fields, providing knowledge and expertise to incorporate reliability-specific attributes into the design of systems / products / devices / processes.  We want to assure that a system will perform its intended function for the required duration within a given environment, including the ability to test and support it throughout its total life cycle.  This is accomplished concurrently with other design disciplines by contributing to the planning and the selection of the system architecture, HW & SW design implementation, materials, processes, and components; followed by verifying the selections made by thorough analysis and test and then sustainment.

Please visit our web site often. It is is the gateway to the many resources that the RS makes available to its members and others interested in the broad aspects of Reliability and Specialty Engineering.   Now that you've joined us at our web site, consider joining the society and help us foster the advancement!

Learn more about the benefits of RS membership.

• Call for Applications Editor-in-Chief of IEEE Reliability magazine. Click [HERE] for more details.
• IEEE Reliability Society AdCom Call for Applications for the 2027/2028/2029 Term, click [HERE] for more information
• Join the IEEE Reliability Society’s TRUE AI Initiative to help shape trustworthy, robust, understandable, and explainable AI for the reliability- and safety-critical systems of tomorrow. Click [HERE] for more details
• Congratulations to the new class of IEEE Reliability Society AdCom members elected for the three-year term, January 1, 2026 – December 31, 2028:
  • Trevor Craney
  • Matthew Hu
  • Joseph Scalise
  • Jeffrey Voas
  • Wei Zhang
  • Ruolin Zhou
• IEEE Reliability Society 2026 Elected Officers
  
  • President  
    • Jason Rupe
  • VP Membership
    
    • Scott Tamashiro
  • VP Publications
    
    • Janet Lin
  • 2026 VP Technical Activities
    • Ruolin Zhou
  • 2026 VP Meetings and Conferences
    • Preeti Chauhan
• IEEE Reliability Society 2025 Major Awards
  
  • Lifetime Achievement Award
    • Jeff Voas
    • Doron Drusinsky
  • Richard Kowalski Outstanding Service Award
    • Yun Lin
    • Jeff Voas
  • Annual Reliability Society (Reliability Engineer of the Year)  
    • Wei Zhang
  • Reliability Society Education Award  
    • Lina Bertling Tjernberg
• Call for Papers: 2026 European Conference on Reliability, Availability, Maintainability, and Safety (R.A.M.S. Europe). Click HERE for more details.
• We are pleased to announce that Prof. Steven Li has been appointed the new Editor-in-Chief of IEEE Transactions on Reliability. His term will officially begin on June 1, 2025.
• The US Defense Acquisition University (DAU) offers technical courses that are free for US citizens. This third-party link is provided for informational purposes only. IEEE is not recommending or endorsing any DAU course or its use, and IEEE makes no representation or warranty whatsoever regarding any DAU course.  
  The link to the DAU is : www.dau.edu
  The Link to the DAU course catalog is: icatalog.dau.edu
• Visit the Reliability Society’s failure database site. This database is a website built for you to enter failure events from your own experience or research, browse documented failures, and find inspiration for your reliability-centered research. More information on the Failure Database can be found in Reliability magazine. And don’t forget to participate in the Failure Database entry contest! Beginning at midnight April 1, 2024 EST and ending at midnight April 30 EST, the submitter of the 1st, 10th, 50th, 100th and last valid entries (based on the timestamp) each will win a $50 Amazon gift card. More information on the Failure Database and the contest can be found in Reliability Magazine.
• Reliability Magazine is here! Don’t forget to read the inaugural issue of Reliability here View the Current Issue. You will need to log in as an IEEE member to access full content. This interesting and informative, quarterly magazine is free to all IEEE Reliability Society members! Submissions of articles, reviews and other appropriate content are welcome. Please query the Editor-in-Chief, Phil Laplante for more information.
• A Beta version of a new Reliability Analytics Toolkit is available for inspection. Try it!

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